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Reseach Article

A Cost Effective Built-in-Self Test for Second Order Sigma Delta Modulator

Published on May 2015 by Ritika Upadhyay, Anil Kumar Sahu
National Conference Potential Research Avenues and Future Opportunities in Electrical and Instrumentation Engineering
Foundation of Computer Science USA
ACEWRM2015 - Number 3
May 2015
Authors: Ritika Upadhyay, Anil Kumar Sahu
2917ce89-e59d-484f-9e95-9f86d4ed2aa7

Ritika Upadhyay, Anil Kumar Sahu . A Cost Effective Built-in-Self Test for Second Order Sigma Delta Modulator. National Conference Potential Research Avenues and Future Opportunities in Electrical and Instrumentation Engineering. ACEWRM2015, 3 (May 2015), 29-33.

@article{
author = { Ritika Upadhyay, Anil Kumar Sahu },
title = { A Cost Effective Built-in-Self Test for Second Order Sigma Delta Modulator },
journal = { National Conference Potential Research Avenues and Future Opportunities in Electrical and Instrumentation Engineering },
issue_date = { May 2015 },
volume = { ACEWRM2015 },
number = { 3 },
month = { May },
year = { 2015 },
issn = 0975-8887,
pages = { 29-33 },
numpages = 5,
url = { /proceedings/acewrm2015/number3/20915-6047/ },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Proceeding Article
%1 National Conference Potential Research Avenues and Future Opportunities in Electrical and Instrumentation Engineering
%A Ritika Upadhyay
%A Anil Kumar Sahu
%T A Cost Effective Built-in-Self Test for Second Order Sigma Delta Modulator
%J National Conference Potential Research Avenues and Future Opportunities in Electrical and Instrumentation Engineering
%@ 0975-8887
%V ACEWRM2015
%N 3
%P 29-33
%D 2015
%I International Journal of Computer Applications
Abstract

Testing of high resolution second order sigma delta (??) modulator is a very expensive process. With the advanced technology, where the complexity over a small area is increasing, then testing at low cost with good accuracy is becoming a tedious issue for the manufacturing process. The cost effectiveness can be calculated on the basis of different parameters of the ?? modulator such as SNDR, ENOB, Gain, Offset, THD, SNR etc. Testing time also play an important role in the cost effectiveness of the modulator. The Built-in-self-test (BIST) allows the machine or circuit to test itself. BIST is desirable for the VLSI system in order to reduce the cost per chip of production –time testing by the manufacture, it can also provide the means to perform in-the field diagnostic. Therefore, this paper will demonstrate a possibility to simplify modeling and simulation of testing strategy of high-resolution ?? modulator using MATLAB SIMULINK environment. Here, we are finding the cost effectiveness on the basis of Signal to Noise Distortion Ratio (SNDR) for the ?? modulator BIST. A ?? modulation based signal generator is considered which can produce analog sinusoidal test stimuli and digital reference signal on chip. By comparing the ADC output with that of the generator reference signal, the parameter can be determined on chip based on the standard equations in the proposed simulation environment.

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Index Terms

Computer Science
Information Sciences

Keywords

Sigma Delta Modulator Built-in-self-test Sigma Delta Adc