Call for Paper - August 2020 Edition
IJCA solicits original research papers for the August 2020 Edition. Last date of manuscript submission is July 20, 2020. Read More

Testing Effort Dependent Software Reliability Growth Model with Dynamic Faults for Debugging Process

Print
PDF
International Journal of Computer Applications
© 2015 by IJCA Journal
Volume 113 - Number 11
Year of Publication: 2015
Authors:
Mohammad Altaf Dar
D N Gowsami
Anshu Chaturvedi
10.5120/19867-1851

Mohammad Altaf Dar, D N Gowsami and Anshu Chaturvedi. Article: Testing Effort Dependent Software Reliability Growth Model with Dynamic Faults for Debugging Process. International Journal of Computer Applications 113(11):1-4, March 2015. Full text available. BibTeX

@article{key:article,
	author = {Mohammad Altaf Dar and D N Gowsami and Anshu Chaturvedi},
	title = {Article: Testing Effort Dependent Software Reliability Growth Model with Dynamic Faults for Debugging Process},
	journal = {International Journal of Computer Applications},
	year = {2015},
	volume = {113},
	number = {11},
	pages = {1-4},
	month = {March},
	note = {Full text available}
}

Abstract

In present era people depend on both hardware and software system. As software system is engrafted in every aspect of computer system, the desired quality of software is an essential concern for many critical system. From last few decades, many software reliability growth models were developed to analyze the growth of reliability. For improving the quality of software, SRGM plays an essential role. The present study proposed a Software Reliability Growth Model with testing effort and dynamic fault. The parameters involved in the proposed model are estimated using least square estimation. The performance of the proposed model is validated using Mean Square Error (MSE), Akaike Information Criterion (AIC) and R Squared Error (R2). A proposed Model is compared with existing models reported in literature, and it has been observed that proposed model performed better.

References

  • Goel and Okumoto, 1979 "Time dependent error-detection rate model for software reliability and other performance measures," IEEE Trans. Reliab. pp. 206–211
  • Kimura, Yamada and Osaki, 1992 "Software reliability assessment for an exponential S-shaped reliability growth phenomenon," Comput. Math. Appl. , pp. 71–78
  • Huang, Kuo and Lyu, 1999, Optimal software release policy based on cost and reliability with testing efficiency, 23rd International Conference on Computer Software and Applications, pp. 468–473
  • Huang and Kuo, 2002, Analysis of incorporating logistic testing-effort function into software reliability modelling, IEEE Trans. Reliab. pp. 261-270
  • Popstojanova and Trivedi, 2003, Architecture-based approaches to software reliability prediction, Comput. Math. Appl. pp. 1023–1036
  • Lo, Huang, Chen, Kuo and Lyu, 2005, Reliability assessment and sensitivity analysis of software reliability growth modeling based on software module structure," J. Syst. Softw. pp. 3–13
  • Huang, 2005, Performance analysis of software reliability growth models with testing-effort and change-point, J. Syst. Softw. pp. 181–194
  • Huang, 2005, Cost-reliability-optimal release policy for software reliability models incorporating improvements in testing efficiency," J. Syst. Softw. pp 139–155
  • Yamada and Osaki, 1985, Software reliability growth modeling: models and applications, IEEE Trans. Softw. Eng. pp. 1431–1437
  • Yamada, Ohtera and Norihisa, 1986, Software reliability growth model with testing-effort, IEEE Trans. Reliab. pp. 19–23
  • Kapur, Goswami, and Gupta, 2004, A Software reliability growth model with testing effort dependent learning function for distributed systems," Int. J. of Reliab. , Qual. , Safety Eng. . pp. 365-377
  • Pachauri, Kumar and Dhar, 2014, Software reliability growth model with dynamic faults and optimal release time optimization using GA and MAUNT," Applied Math. , and comput. , pp 500-509
  • Quadri, Ahmad, Peer and Kumar, 2006, Non-homogeneous Poisson process software reliability growth model with generalized exponential testing effort function, RAU J. Res. pp. 159–163
  • Huang, Kuo and Lyu, 2007, An assessment of testing-effort dependent software reliability growth models, IEEE Trans. Reliab. pp. 198–211
  • Ahmad, Bokhari, Quadri, and Khan, 2008, The exponentiated Weibull software reliability growth model with various testing-efforts and optimal release policy, Int. J. Qual. Reliab. Manag. pp. 211–235
  • Ahmad, Khan, Quadri and Kumar, 2009, Modeling and analysis of software reliability with Burr type-X testing-effort and release-time determination," J. Model. Manag. pp. 28–54
  • Rafi, Rao and Akhtar, 2010, Incorporating generalized modified Weibull TEF in to software reliability growth model and analysis of optimal release policy," Comput. Inf. Sci. pp. 145–162
  • Rafi, Rao, and Akhtar, 2010, Software reliability growth model with logistic exponential test-effort function and analysis of software release policy," Int. J. Comput. Sci. Eng. pp. 387–399
  • Rafi and Akthar, 2010, Software reliability growth model with Gompertz TEF and optimal release time determination by improving the test efficiency, Int. J. Comput. Appl. pp. 34–43
  • Brooks and Motley, 1980, Analysis of discrete software reliability models, RADC-TR, 80-84
  • Misra,1983, Software reliability analysis," IBM Sys. J. , pp. 262-270
  • Xie and Murthy, 2003, A modified Weibull distribution," IEEE Trans. Reliab. pp. 33–37