CFP last date
20 May 2024
Reseach Article

Design and Analysis of Transient Fault Tolerance in SRAM with different NT Techniques

by S. Ravichand, T. Madhu, M. Sailaja
International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 151 - Number 3
Year of Publication: 2016
Authors: S. Ravichand, T. Madhu, M. Sailaja
10.5120/ijca2016911694

S. Ravichand, T. Madhu, M. Sailaja . Design and Analysis of Transient Fault Tolerance in SRAM with different NT Techniques. International Journal of Computer Applications. 151, 3 ( Oct 2016), 6-10. DOI=10.5120/ijca2016911694

@article{ 10.5120/ijca2016911694,
author = { S. Ravichand, T. Madhu, M. Sailaja },
title = { Design and Analysis of Transient Fault Tolerance in SRAM with different NT Techniques },
journal = { International Journal of Computer Applications },
issue_date = { Oct 2016 },
volume = { 151 },
number = { 3 },
month = { Oct },
year = { 2016 },
issn = { 0975-8887 },
pages = { 6-10 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume151/number3/26211-2016911694/ },
doi = { 10.5120/ijca2016911694 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T23:56:05.539769+05:30
%A S. Ravichand
%A T. Madhu
%A M. Sailaja
%T Design and Analysis of Transient Fault Tolerance in SRAM with different NT Techniques
%J International Journal of Computer Applications
%@ 0975-8887
%V 151
%N 3
%P 6-10
%D 2016
%I Foundation of Computer Science (FCS), NY, USA
Abstract

In digital domain applications one of the main important analyses is to check the system performance even if the fault is occurred. This paper describes the fault tolerance technique based on the software approach for SRAM memory unit present in the multi core system using Processor Level Redundancy (PLR). The PLR proceeds with software-centric approach, soft fault tolerance which ensuring a correct software execution. In this approach we applied here only for SRAM available in the processor. This scheme is used at user space level which does not necessitate changes to the original application. In this approach is used to detect the soft errors presented in the memory unit and it will recover from the fault without stop the process of the memory unit. To design the SRAM here we use the different nT technique. The main goal of this approach is which implements fault error detection and fault recovery mechanism to check the performance of the memory unit. This paper presents software based nT for SRAM design and analysis transient fault tolerance using Process Level Redundancy (PLR) is lower when comparable to existed.

References
  1. Alex Shye, Student Member, IEEE, Joseph Blomstedt, ‘PLR: A Software Approach to Transient Fault Tolerance for Multi core Architectures’ IEEE Transactions on Dependable and Secure Computing (TDSC). April-June 2009 (vol. 6 no. 2) pp. 135-148.
  2. .Alex Shye Tipp Moseley† Vijay Janapa Reddi Joseph Blomstedt Daniel A. Connors(2013),‘Using Process-Level Redundancy to Exploit Multiple Cores for Transient Fault Tolerance’ In proceedings of the 37th IEEE/IFIP International Conference on Dependable Systems and Networks (DSN). Edinburgh, UK. June 25-28, 2007.
  3. . Christopher Weaver1, Joel Emer1, Shubhendu S. Mukherjee1, and Steven K. Reinhardt ‘Techniques to Reduce the Soft Error Rate of a High Performance Microprocessor’, Proc. Ninth Int’l Conf. Architectural Support for Programming Languages, 1, 2-Jan.2007.
  4. . R. L. Graham, S.-E. Choi, D. J. Daniel, N. N. Desai, R. G. Minnich, C. E. Rasmussen, L. D. Risinger, and M. W. Sukalski.”A network-failure-tolerant message-passing system for terascale clusters. In ICS. New York, USA, June. 22-26 2002.
  5. . Hamid Mushtaq, Zaid Al-Ars, Koen Bertels),‘Efficient Software-Based Fault Tolerance Approach on Multi core Platforms’ Proc. 37th Int’l Conf. Dependable Systems and Networks, DSN ’10.
  6. . Iwagaki, T; nakaso, t ohkubo, r; Ichihara, h ,’Scheduling algorithm in data path synthesis for long duration transient fault tolerance’, IEEE Reliability Physics Tutorial Notes, Reliability Fundamentals, pp. 121_01.1-121_01.14. Feb. 2009.
  7. . Karthik, Sundaramoorthy, Zach Purser Eric Rotenberg, ‘Slipstream processors: improving both performance and fault tolerance’, in Proc. Ninth Int’l Conf. Architectural Support for Programming Languages and Operating Systems (ASPLOS), July .2008.
  8. . S.K. Reinhardt and S.S. Mukherjee, “Transient Fault Detection via Simultaneous Multithreading,” Proc. 27th Ann. Int’l Symp. Computer Architecture (ISCA), 2000.
  9. . Karnik, T.; Bloechel, B.; Soumyanath, K.; De, V.; Borkar, S., "Scaling trends of cosmic ray induced soft errors in static latches beyond 0.18 /spl mu/," in VLSI Circuits, 2001. Digest of Technical Papers. 2001 Symposium on , vol., no., pp.61-62, 14-16 June 2001doi: 10.1109/VLSIC.2001.934195.
  10. . Kottke, T.; Steininger, A., "A Fail-Silent Reconfigurable Superscalar Processor," in Dependable Computing, 2007. PRDC 2007. 13th Pacific Rim International Symposium on , vol., no., pp.232-239, 17-19 Dec. 2007 doi: 10.1109/PRDC. 2007.16.
  11. . T.N. Vijaykumar, I. Pomeranz, and K. Cheng, “Transient-Fault Recovery Using Simultaneous Multithreading,” Proc. 29th Int’l Symp. Computer Architecture (ISCA), 2002.
  12. . N. Oh et al.,‘Error Detection by Duplicated Instructions in Super- Scalar Processors’, IEEE Trans. Reliability, vol. 51, no. 1.Mar 2002.
  13. . Reis, G. A., Chang, J., Vachharajani, N., Rangan, R., August, D. I.: SWIFT: Software Implemented Fault Tolerance. In: Proceedings of the International Symposium on Code generation and optimization, pp. 243–254. IEEE Press, Washington DC (2005).
  14. . Kulkarni, S.S.; Ebnenasir, A., "Complexity issues in automated synthesis of failsafe fault-tolerance," in Dependable and Secure Computing, IEEE Transactions on , vol.2, no.3, pp.201-215,July-Sept.2005 doi: 10.1109/TDSC.2005.29.
  15. .Karnik, T.; Bloechel, B.; Soumyanath, K.; De, V.; Borkar, S., "Scaling trends of cosmic ray induced soft errors in static latches beyond 0.18 /spl mu/," in VLSI Circuits, 2001. Digest of Technical Papers. 2001 Symposium on , vol., no., pp.61-62, 14-16 June 2001doi: 10.1109/VLSIC.2001.934195.
Index Terms

Computer Science
Information Sciences

Keywords

SRAM Fault Tolerance Process Level Redundancy nT design