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Analysis of Don’t Care Bit Filling Techniques for Optimization of Compression and Scan Power
| International Journal of Computer Applications |
| Foundation of Computer Science (FCS), NY, USA |
| Volume 18 - Number 3 |
| Year of Publication: 2011 |
| Authors: K. A. Bhavsar, U. S.Mehta |
10.5120/2262-2907
|
K. A. Bhavsar, U. S.Mehta . Analysis of Don’t Care Bit Filling Techniques for Optimization of Compression and Scan Power. International Journal of Computer Applications. 18, 3 ( March 2011), 30-34. DOI=10.5120/2262-2907
Abstract
Test power and test time have been the major issues for current scenario of VLSI testing. The test data compression is the well known method used to reduce the test time. The don’t care bit filling method can be used for effective test data compression as well as reduction in scan power. In this paper we describe the algorithm for don’t care assignment like MT(Minimum Transition)-fill technique and hamming distance based technique.The selective Huffman ,optimal Huffman and modified selective Huffman coding are applied on the mapping set to give the optimum Compression and weighted transition matrix is used for scan power Using these techniques find compression and scan power parameters like average power and peak power and conclude that MT- fill technique gives low peak and average powers and Hamming distance based modified selective Huffman coding technique gives higher compression ratio compare to another methods like selective and optimal Huffman coding.
References
- N.A.Tauba (2006) Survey of Test Vector Compression Techniques :proceeding IEEE transcaction Design & Test of Computers-2006
- Mehta U, Dasgupta K, Devashrayee N (2009) Survey of Test Data Compression Techniques Emphasizing Code Based Scheme : proceeding IEEE 12th Euromicro Conference on Digital System Design(DSD09)
- Mehta U, Dasgupta K, Devashrayee N (2009) Frequency dependant bit appending: an enhancement to statistical codes for test data compression. :Proceedings of the India Conference,NDICON’09, December 2009, pp 301–304
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- Mehta U, Dasgupta K, Devashrayee N (2010) Modified Selective Huffman Coding for Optimization of Test Data Compression ,Test Application Time and Area Overhead :Proceeding in Journal of Electronic Testing Theory and Applications-2010,vol.26
- R.Sankaralingam, R. Oruganti and N. Touba(2000) Static Compaction Techniques to Control Scan vector Power Dissipation :Proceeding in IEEE VLSI Test Symposium-2000,pp. 35-42
- Mehta U, Dasgupta K, Devashrayee N (2010) Run Length Based Test Data Compression Techniques:How Far From Entropy and Power Bounds?:proceeding in VLSI Design from Hindawi Publication Corporation-2010
- K.A.Bhavsar Mehta U(2011), Analysis of Test Data Compression Techniques Emphazing Statistical Coding Schemes:proceeding in ACM Digital Library USA
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