International Journal of Computer Applications |
Foundation of Computer Science (FCS), NY, USA |
Volume 187 - Number 23 |
Year of Publication: 2025 |
Authors: Pradeepkumar Palanisamy |
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Pradeepkumar Palanisamy . Intelligent Flaky Test Detection using Historical Failure Patterns: An AI-Driven Approach to Enhance Software Reliability. International Journal of Computer Applications. 187, 23 ( Jul 2025), 37-43. DOI=10.5120/ijca2025925458
The burgeoning complexity of modern software systems, coupled with accelerated Continuous Integration/Continuous Deployment (CI/CD) pipelines, has exacerbated the pervasive challenge of flaky tests – non-deterministic failures that undermine developer confidence and impede release velocity. This paper introduces a novel, AI-driven framework engineered to proactively identify, diagnose, and mitigate flaky test failures by intelligently analyzing vast repositories of historical CI/CD data and a diverse array of external contextual signals. Our framework employs a sophisticated ensemble of machine learning models, including deep learning architectures for temporal pattern recognition and graph neural networks for dependency analysis, to precisely isolate the latent root causes of flakiness. Beyond mere detection, the system leverages Explainable AI (XAI) techniques to provide transparent insights into failure mechanisms and proposes intelligent remediation strategies, ranging from automated test quarantines and dynamic test re-prioritization to prescriptive recommendations for test refactoring or code modification. By continuously learning from evolving failure patterns, these AI models not only dramatically improve the stability and throughput of software delivery pipelines but also furnish invaluable, real-time historical insights into test reliability trends, empowering data-driven decision-making, fostering proactive quality assurance, and ultimately cultivating a culture of enhanced software quality and predictability.