CFP last date
20 May 2024
Call for Paper
June Edition
IJCA solicits high quality original research papers for the upcoming June edition of the journal. The last date of research paper submission is 20 May 2024

Submit your paper
Know more
The week's pick
Responsive image
Enhancing Privacy Preservation: Multi-Attribute Protection with P-Sensitive K-Anonymity

Twinkle Patel Kiran Amin
Random Articles
Reseach Article

Fabric Defect Detection in Handlooms Cottage Silk Industries using Image Processing Techniques

by R. S. Sabeenian, M. E. Paramasivam, P. M. Dinesh
journal cover thumbnail

International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 58 - Number 11
Year of Publication: 2012
Authors: R. S. Sabeenian, M. E. Paramasivam, P. M. Dinesh
10.5120/9326-3631

R. S. Sabeenian, M. E. Paramasivam, P. M. Dinesh . Fabric Defect Detection in Handlooms Cottage Silk Industries using Image Processing Techniques. International Journal of Computer Applications. 58, 11 ( November 2012), 21-29. DOI=10.5120/9326-3631

@article{ 10.5120/9326-3631,
author = { R. S. Sabeenian, M. E. Paramasivam, P. M. Dinesh },
title = { Fabric Defect Detection in Handlooms Cottage Silk Industries using Image Processing Techniques },
journal = { International Journal of Computer Applications },
issue_date = { November 2012 },
volume = { 58 },
number = { 11 },
month = { November },
year = { 2012 },
issn = { 0975-8887 },
pages = { 21-29 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume58/number11/9326-3631/ },
doi = { 10.5120/9326-3631 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T21:02:46.843929+05:30
%A R. S. Sabeenian
%A M. E. Paramasivam
%A P. M. Dinesh
%T Fabric Defect Detection in Handlooms Cottage Silk Industries using Image Processing Techniques
%J International Journal of Computer Applications
%@ 0975-8887
%V 58
%N 11
%P 21-29
%D 2012
%I Foundation of Computer Science (FCS), NY, USA
Abstract

Detection of defect on finished fabrics and their classification based on their appearance plays a vital role in inspection of both hand-woven and machine woven fabrics. Generally the defect detection process is carried out by making use of the manual effort, during which some of fabric defects are very small and undistinguishable and can be identified only by monitoring the variation in the intensity falling on the fabric. Till date, most of the fabric industries in India carry out the process of defect detection by making use of a very skilled labor. An automated system that could detect defects and identify them based on their physical appearance would naturally enhance the product quality and result in improved productivity to meet both customer demands and reduce the costs associated with off-quality. This paper focuses on developing algorithms to check if a given fabric contains any one of the defects listed out in [1] and if so, what kind of defect and the location of the defect within the analyzed area. The next sections of the paper deal with the defect detection process using Multi Resolution Combined Statistical and Spatial Frequency (MRCSF), Markov Random Field Matrix method (MRFM), Gray Level Weighted Matrix (GLWM) and Gray Level Co-occurrence Matrix (GLCM).

References
  1. R S Sabeenian, M E Paramasivam and P M Dinesh, "Computer Vision based Defect Detection and Identification in Handlooms Silk Fabrics", International Journal of Computer Applications 42(17):41-48, March. Published by Foundation of Computer Science, New York, USA, 2012.
  2. Kumar, A. 2008. "Computer-Vision-Based Fabric Defect Detection: A Survey", IEEE Transactions on Industrial Electronics, DOI: 10. 1109/TIE. 1930. 896476
  3. R. T. Chin and C. A. Harlow. 1982. "Automated visual inspection: A survey," IEEE Transactions in Pattern Analysis Mach. Intelligence.
  4. T. S. Newman and A. K. Jain. 1985. "A survey of automated visual inspection," Computer Vision Image Understanding,.
  5. A. D. H. Thomas, M. G. Rodd, J. D. Holt, and C. J. Neill. 1995. "Real-time industrial inspection: A review," Real- Time Imaging.
  6. Escofet J. , Milan M. S. and Rallo M. 2001, "Modelling of Woven Fabric structures based on Fourier Image analysis". Appl. Opt. ,
  7. Henry Y. T. N. , Grantham K. H. P. , Nelson H. C. Y. 2008. "Motif-Based defect detection for patterned fabric". Pattern Recognition Letters.
  8. Mak K. L. and Peng P, "Detecting Defects in Textile Fabrics with Optimal Gabor Filters", In eht proceedings of World Academy of Science, Engineering and Technology, 2006.
  9. Arivazhagan S. and Ganesan L. 2003, "Texture Classification using Wavelet Transform". Pattern Recognition Letters.
  10. Arivazhagan S. , Ganesan L. and Bama S. 2006. "Fault segmentation in fabric images using Gabor wavelet transform", International Journal of Machine Vision and Applications.
  11. Diagnostic Study of Trichy Handlooms Cluster under the MSME Clusters.
  12. Sabeenian R. S. and Palanisamy V, "Texture Based Medical Image Classification of Computed Tomography images using MRCSF", International Journal of Medical Engineering and Informatics (IJMEI), Vol. 1, No. 4 pp. 459-472 July 2009.
  13. Sabeenian R. S. and Palanisamy V. , "Texture Based Weed Detection Using Multi Resolution Combined Statistical and spatial Frequency", International Journal of Information and Communication Engineering (ISSN 2070-3740), Vol. 52, pp. 549-553. April 2009.
  14. Sabeenian R. S and M. E. Paramasivam. 2010. "Defect detection and Identification in Textile Fabrics using Multi Resolution Combined Statistical and spatial Frequency Method". In the proceedings of IEEE International Advance Computing Conference (IACC 2010). DOI: 10. 1109/ IADCC. 2010. 54.
  15. Sabeenian R. S and M. E. Paramasivam. 2010. "An Efficient Bit Reduction Binary Multiplication Algorithm using Vedic Methods". In the proceedings of IEEE International Advance Computing Conference (IACC 2010). DOI:10. 1109/IADCC. 2010. 54.
  16. Sabeenian R. S and Dinesh P. M. 2011. "Texture Image Classification Using Gray Level Weight Matrix (GLWM)". In the Proceedings of International Conference of Advances in Information Technology and Mobile Communication (AIM'11) DOI: 10. 1007/978-3-642-20573-6_43
  17. Sabeenian R. S and M. E. Paramasivam. 2010. "Handlooms Silk Fabric Defect Detection using First order Statistical Features on a NIOS II Processor" In the Proceedings of Springer International Conference on Advances in Information and Communication Technologies ICT 2010. DOI: 10. 1007/978-3-642-15766-0_77.
  18. Sabeenian R. S. , Paramasivam . M. E and P. M. Dinesh. , "Detection and Location of Defects in Handlooms Cottage Silk Fabrics using MRMRFM & MRCSF" International Journal of Technology And Engineering System (IJTES): Jan – March 2011.
  19. Sabeenian R. S, Paramasivam M. E. and Dinesh P. M. 2011. "Face Recognition Using Gray Level Weight Matrix (GLWM)" In the proceedings of Second International Conference on Advances in Power Electronics and Instrumentation Engineering (PEIE'11), DOI: 10. 1007/978-3-642-20499-9_11
  20. Sabeenian R. S and P. M. Dinesh, 2010, "Multi Format Scalable Media Decoder Implementation using OMAP3530". In the proceedings of International Conference on Computational Intelligence and Computing Research (ICCIC'10) DOI: 10. 1109/ ICCIC. 2010. 5705846. .
  21. Sabeenian R. S and P. M. Dinesh, 2010. "Digital Watermarking using Multi Resolution Statistical and Markov Random Field Matrix (MRSMRFM)". In the Proceedings of IEEE International Conference on Advances in Communication, Network and Computing CNC 2010 DOI 10. 1109/CNC. 51.
  22. Haralick R. M. , Shangmugam K. and Dinstein L. 1973, "Textural Features for Image Classification", IEEE Transactions on Systems, Man, and Cybernetics,.
  23. Sabeenian R. S. "Texture Image Classification using Multi Resolution Combined Statistical and Spatial Frequency Method" International Journal of Technology And Engineering System (IJTES): Jan – March 2011.
  24. Sabeenian R. S. and Palanisamy V, "Texture Image Classification using Gabor Statistical Features (GSF) and Wavelet Statistical Features (WSF)". International Journal of Computer Science and Applications (ISSN No. 0974-0767) June 2010.
Index Terms

Computer Science
Information Sciences

Keywords

Defect Detection in Silk Fabrics Pattern Recognition

Powered by PhDFocusTM