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Analysis of Noise Figure of GaN HEMT at High Frequency Range for Microwave Applications
| International Journal of Computer Applications |
| Foundation of Computer Science (FCS), NY, USA |
| Volume 70 - Number 20 |
| Year of Publication: 2013 |
| Authors: Shakti Tripathi, Gurjit Kaur |
10.5120/12183-8223
|
Shakti Tripathi, Gurjit Kaur . Analysis of Noise Figure of GaN HEMT at High Frequency Range for Microwave Applications. International Journal of Computer Applications. 70, 20 ( May 2013), 15-18. DOI=10.5120/12183-8223
Abstract
Microwave and Millimeter Wave Integrated Circuits have experienced a tremendous growth over the last five decades. Circuits have become smaller, highly integrated, lower in cost, and have found extensive applications in radar, electronic warfare and the commercial field. MMIC approach is being used extensively these days where silicon technology is failing with the increase demand in low cost, less power consuming, more compact electronic devices. One of the very convincing MMIC approach has been discussed here is GaN HEMT. The small signal and noise analysis has been done and the results obtained which could act as a driving factor in many microwave applications.
References
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