CFP last date
20 May 2024
Call for Paper
June Edition
IJCA solicits high quality original research papers for the upcoming June edition of the journal. The last date of research paper submission is 20 May 2024

Submit your paper
Know more
The week's pick
Responsive image
Enhancing Privacy Preservation: Multi-Attribute Protection with P-Sensitive K-Anonymity

Twinkle Patel Kiran Amin
Random Articles
Reseach Article

Detection of Defect Potentials using Peer Reviews: An Agile Approach

by Chandravardhan Singh Raghaw, Prakriti Trivedi, Vipul Sharma
journal cover thumbnail

International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 76 - Number 11
Year of Publication: 2013
Authors: Chandravardhan Singh Raghaw, Prakriti Trivedi, Vipul Sharma
10.5120/13294-0872

Chandravardhan Singh Raghaw, Prakriti Trivedi, Vipul Sharma . Detection of Defect Potentials using Peer Reviews: An Agile Approach. International Journal of Computer Applications. 76, 11 ( August 2013), 42-46. DOI=10.5120/13294-0872

@article{ 10.5120/13294-0872,
author = { Chandravardhan Singh Raghaw, Prakriti Trivedi, Vipul Sharma },
title = { Detection of Defect Potentials using Peer Reviews: An Agile Approach },
journal = { International Journal of Computer Applications },
issue_date = { August 2013 },
volume = { 76 },
number = { 11 },
month = { August },
year = { 2013 },
issn = { 0975-8887 },
pages = { 42-46 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume76/number11/13294-0872/ },
doi = { 10.5120/13294-0872 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T21:45:39.725254+05:30
%A Chandravardhan Singh Raghaw
%A Prakriti Trivedi
%A Vipul Sharma
%T Detection of Defect Potentials using Peer Reviews: An Agile Approach
%J International Journal of Computer Applications
%@ 0975-8887
%V 76
%N 11
%P 42-46
%D 2013
%I Foundation of Computer Science (FCS), NY, USA
Abstract

Maintain quality is always an important issue for the software end product. This paper includes how to improve quality of product by detecting possible number of defects potentials. The authors are using an approach called Peer Review for detection of defect potential. In this paper peer review is done using an agile approach. A study has been conducted on three final year projects and includes the detection of maximum number of defect potentials using different peer review techniques. Finally, as a result, total numbers of defects with different review techniques are compared with possible defects.

References
  1. Roger S. Pressman, Software Engineering: A Practitioner's Approach, 5th ed. New York, U. S. A. : McGraw-Hill, 2001, ch. 19, pp. 508.
  2. McCall, J. P. Richards and G. Walters, "Factors in Software Quality," three volumes, NTIS AD-A049-014, 015, 055, November 1977.
  3. Capers Jones, "Measuring Defect Potentials and Defect Removal Efficiency", The Journal of Defense Software Engineering, June 2008
  4. David Longstreet, "Fundamentals of Function Point Analysis". Available: http://www. softwaremetrics. com/Articles/defects. htm.
  5. Ms Ramandeep Kaur, Mrs Manmohan Choudhary, Mr Rahul Mehta, "Agile Process: An Enhancement to The Process Of Software Development", IJCSNS International Journal of Computer Science and Network Security, vol. 12, No. 7, July 2012
  6. Ian Sommerville, Software Engineering, 9th ed. Boston, U. S. A. : Pearson, 2011, ch. 3, pp. 59.
  7. Vahid Garousi, "Applying Peer Reviews in Software Engineering Education: An Experiment and Lessons Learned", IEEE Transactions on Education, vol. 53, No. 2, May 2010
  8. Karl E. Wiegers, Peer Reviews in Software: A Practical Guide Reading, Addison-Wesley, 2002.
  9. M. B. Chrissis, M. Konrad, and S. Shrum, CMMI: Guideline for Process Integration and Product Improvement. Reading, MA: Addison-Wesley, 2003.
  10. "Training course: Electrical engineering for buildings, industry & utilities," Ballengearry Consulting, Last accessed Apr. 2008. Available: http://ballengearry. com. au/ee01. html.
  11. A. E. Gallegos, "Environmental restoration project quality procedure for design review," U. S. Dept. of Energy, Document Catalog #ER2002-0352, 2002.
  12. Use of Peer Reviews for Projects, Policy #117, American Society of Civil Engineers, Last accessed Aug. 2008. Available: http://www. asce. org/pressroom/news/policy_details. cfm?hdlid=117.
  13. "Engineering peer reviews (Revision: 1. 0)," NASA Goddard Space Flight Center, Reference GPG 8700. 6, 2005.
  14. "Guidelines for peer review in the ?re protection design process," Society of Fire Protection Engineers, Last accessed Aug. 2008. Available: http://www. sfpe. org/upload/peer_review_guidelines. pdf.
  15. B. Boehm and V. R. Basili, "Software defect reduction top 10 list," IEEE Comput. , vol. 34, no. 1, pp. 135–137, Jan. 2001.
  16. R. L. Glass, "Inspections-Some interesting findings," Commun. ACM, vol. 42, no. 4, pp. 17–19, 1999.
  17. Roger S. Pressman, Software Engineering: A Practitioner's Approach, 5th ed. New York, U. S. A. : McGraw-Hill, 2001, ch. 4, pp. 89.
  18. Roger S. Pressman, Software Engineering: A Practitioner's Approach, 5th ed. New York, U. S. A. : McGraw-Hill, 2001, ch. 4, pp. 90.
  19. Arthur, L. J. , Measuring Programmer Productivity and Software Quality, Wiley-Interscience, 1985.
Index Terms

Computer Science
Information Sciences

Keywords

Defect Potential Peer Review Agile Approach

Powered by PhDFocusTM