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Design and Implementation of Microcode based Built-In Self-Test for Fault Detection in Memory and its Repair
| International Journal of Computer Applications |
| Foundation of Computer Science (FCS), NY, USA |
| Volume 78 - Number 9 |
| Year of Publication: 2013 |
| Authors: C. Padmini, Ch. Tejdeep |
10.5120/13519-1299
|
C. Padmini, Ch. Tejdeep . Design and Implementation of Microcode based Built-In Self-Test for Fault Detection in Memory and its Repair. International Journal of Computer Applications. 78, 9 ( September 2013), 27-33. DOI=10.5120/13519-1299
Abstract
Memories are the most dominating blocks present on a chip. All types of chips contain embedded memories such as a ROM, SRAM, DRAM, and flash memory. Testing of these memories is a very tedious and challenging job as area over head, testing time and cost of the test play an important role. Embedded memories are occupying a significant portion of the System-on-chip area. Because of this trend and the nature of memory's small geometry, implementing a good memory testing strategy is one of the most significant decision making. Built-In Self-Test, a design technique which uses parts of the circuit to test the circuit itself is used for testing. BIST controller is used to control the total testing process of the memory.
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