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Reseach Article

Dual Material Gate Nanoscale SON MOSFET: For Better Performance

Published on June 2013 by Bibhas Manna, Saheli Sarkhel, Ankush Ghosh, S. S. Singh, Subir Kumar Sarkar
International Conference on Communication, Circuits and Systems 2012
Foundation of Computer Science USA
IC3S - Number 4
June 2013
Authors: Bibhas Manna, Saheli Sarkhel, Ankush Ghosh, S. S. Singh, Subir Kumar Sarkar
39e78d07-6be6-4c03-a5db-16d5058c0247

Bibhas Manna, Saheli Sarkhel, Ankush Ghosh, S. S. Singh, Subir Kumar Sarkar . Dual Material Gate Nanoscale SON MOSFET: For Better Performance. International Conference on Communication, Circuits and Systems 2012. IC3S, 4 (June 2013), 7-9.

@article{
author = { Bibhas Manna, Saheli Sarkhel, Ankush Ghosh, S. S. Singh, Subir Kumar Sarkar },
title = { Dual Material Gate Nanoscale SON MOSFET: For Better Performance },
journal = { International Conference on Communication, Circuits and Systems 2012 },
issue_date = { June 2013 },
volume = { IC3S },
number = { 4 },
month = { June },
year = { 2013 },
issn = 0975-8887,
pages = { 7-9 },
numpages = 3,
url = { /proceedings/ic3s/number4/12304-1344/ },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Proceeding Article
%1 International Conference on Communication, Circuits and Systems 2012
%A Bibhas Manna
%A Saheli Sarkhel
%A Ankush Ghosh
%A S. S. Singh
%A Subir Kumar Sarkar
%T Dual Material Gate Nanoscale SON MOSFET: For Better Performance
%J International Conference on Communication, Circuits and Systems 2012
%@ 0975-8887
%V IC3S
%N 4
%P 7-9
%D 2013
%I International Journal of Computer Applications
Abstract

A simple analytical model of a nanoscale fully depleted dual- material gate (DMG) SOI and SON MOSFETs has been developed and their performance comparison analysis is presented in this paper. An analytical model for the surface potential and threshold voltage has been developed both for these structures using a generalized 2D Poisson's equation solution. The DMG SON MOSFET technology is found to have more potential against various short channel effects (SCEs) thereby offering further device scalability with improved immunity.

References
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Index Terms

Computer Science
Information Sciences

Keywords

Soi/son Mosfet Threshold Voltage Short Channel Effect Dibl