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Analysis of Statistical Code Based Techniques for Optimization of Test Data Compression and Area Overhead

Published on None 2011 by K. A. Bhavsar, U. S.Mehta
journal_cover_thumbnail
International Conference and Workshop on Emerging Trends in Technology
Foundation of Computer Science USA
ICWET - Number 12
None 2011
Authors: K. A. Bhavsar, U. S.Mehta
6b6c9fc7-be2e-428c-bc51-7686c867532e

K. A. Bhavsar, U. S.Mehta . Analysis of Statistical Code Based Techniques for Optimization of Test Data Compression and Area Overhead. International Conference and Workshop on Emerging Trends in Technology. ICWET, 12 (None 2011), 11-18.

@article{
author = { K. A. Bhavsar, U. S.Mehta },
title = { Analysis of Statistical Code Based Techniques for Optimization of Test Data Compression and Area Overhead },
journal = { International Conference and Workshop on Emerging Trends in Technology },
issue_date = { None 2011 },
volume = { ICWET },
number = { 12 },
month = { None },
year = { 2011 },
issn = 0975-8887,
pages = { 11-18 },
numpages = 8,
url = { /proceedings/icwet/number12/2156-esa485/ },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Proceeding Article
%1 International Conference and Workshop on Emerging Trends in Technology
%A K. A. Bhavsar
%A U. S.Mehta
%T Analysis of Statistical Code Based Techniques for Optimization of Test Data Compression and Area Overhead
%J International Conference and Workshop on Emerging Trends in Technology
%@ 0975-8887
%V ICWET
%N 12
%P 11-18
%D 2011
%I International Journal of Computer Applications
Abstract

In this paper it is observed that the test data compression environment (TDCE) parameters : compression ratio and area overhead of code based data compression techniques in statistical method like Huffman coding ,selective Huffman coding ,optimal Huffman coding ,modified selective Huffman, variable length input Huffman coding(VIHC) and split-VIHC and conclude that modified selective Huffman coding method gives higher compression ratio and low area over head.

References
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  8. Giri C, Rao B, Chattopadhyay S (2007) Test data compression by spilt- VIHC (SVIHC). ICCTA ’07: Proceedings of International Conference on Computing: Theory and Applications, March 2007
  9. Mehta U, Dasgupta K, Devashrayee N (2009) Frequency dependant bit appending: an enhancement to statistical codes for test data compression. :Proceedings of the India Conference,NDICON’09, December 2009, pp 301–304
  10. Mehta U, Dasgupta K, Devashrayee N (2010) Modified Selective Huffman Coding for Optimization of Test Data Compression ,Test Application Time and Area Overhead :Proceeding in Journal of Electronic Testing Theory and Applications-2010,vol.26
Index Terms

Computer Science
Information Sciences

Keywords

Compression ratio Area overhead Automatic Test Equipment system-on-a-chip Test Data Compression environment Code Based Data Compression