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Reseach Article

Testing of GALS Components

Published on December 2018 by Deepali Basavaraj Koppad
International Conference on Microelectronic Circuit and System
Foundation of Computer Science USA
MICRO2017 - Number 1
December 2018
Authors: Deepali Basavaraj Koppad
7aa8110f-fd97-4542-a573-1d1acc5cd784

Deepali Basavaraj Koppad . Testing of GALS Components. International Conference on Microelectronic Circuit and System. MICRO2017, 1 (December 2018), 32-36.

@article{
author = { Deepali Basavaraj Koppad },
title = { Testing of GALS Components },
journal = { International Conference on Microelectronic Circuit and System },
issue_date = { December 2018 },
volume = { MICRO2017 },
number = { 1 },
month = { December },
year = { 2018 },
issn = 0975-8887,
pages = { 32-36 },
numpages = 5,
url = { /proceedings/micro2017/number1/30181-1629/ },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Proceeding Article
%1 International Conference on Microelectronic Circuit and System
%A Deepali Basavaraj Koppad
%T Testing of GALS Components
%J International Conference on Microelectronic Circuit and System
%@ 0975-8887
%V MICRO2017
%N 1
%P 32-36
%D 2018
%I International Journal of Computer Applications
Abstract

The purpose of this paper is to perform structural testing on GALS (Globally Asynchronous and Locally Synchronous) components, such as wrapper designs. GALS consists of three main parts: synchronous block, I/O ports and a local clock generator. The I/O Ports and the local clock generator form the wrapper design. Testing has been done for every net in each of the wrapper components. The feedback nets that are usually uncontrollable are also tested using same methodology. The collapse ratio and the maximum number of test vectors required are calculated for every component. A 2:1 mux is used to detect 3 faults that could not be detected using structural testing. Fault coverage of 100% is obtained for every component of the wrappers. The testing is performed on two different wrappers using Pyxis schematic in Mentor Graphics for 180 nm technology.

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Index Terms

Computer Science
Information Sciences

Keywords

Gals Wrapper Testing Fault Coverage.