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Reseach Article

Machine Vision algorithm for PCB Parameters Inspection

Published on May 2012 by Sharat Chandra Bhardwaj
National Conference on Future Aspects of Artificial intelligence in Industrial Automation 2012
Foundation of Computer Science USA
NCFAAIIA - Number 2
May 2012
Authors: Sharat Chandra Bhardwaj
aafcda7c-deca-4142-9160-9a50e9a5f536

Sharat Chandra Bhardwaj . Machine Vision algorithm for PCB Parameters Inspection. National Conference on Future Aspects of Artificial intelligence in Industrial Automation 2012. NCFAAIIA, 2 (May 2012), 20-24.

@article{
author = { Sharat Chandra Bhardwaj },
title = { Machine Vision algorithm for PCB Parameters Inspection },
journal = { National Conference on Future Aspects of Artificial intelligence in Industrial Automation 2012 },
issue_date = { May 2012 },
volume = { NCFAAIIA },
number = { 2 },
month = { May },
year = { 2012 },
issn = 0975-8887,
pages = { 20-24 },
numpages = 5,
url = { /proceedings/ncfaaiia/number2/6735-1014/ },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Proceeding Article
%1 National Conference on Future Aspects of Artificial intelligence in Industrial Automation 2012
%A Sharat Chandra Bhardwaj
%T Machine Vision algorithm for PCB Parameters Inspection
%J National Conference on Future Aspects of Artificial intelligence in Industrial Automation 2012
%@ 0975-8887
%V NCFAAIIA
%N 2
%P 20-24
%D 2012
%I International Journal of Computer Applications
Abstract

An Automated Optical Inspection (AOI) algorithm for printed circuit board (PCB) inspection system proposed in this paper. The proposed method detect holes defect that occur during PCB etching process during manufacturing. The object of PCB inspection algorithm is to develop a more reliable and faster visual inspection system. The inspection process contains two stages, namely, measurement stage and detection stage. In the first stage, only one image feature is measured from the examined image and is used for detection of defects

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Index Terms

Computer Science
Information Sciences

Keywords

Aoi Pcb Defects Image Morphology Particle Analysis Particle Measurement