CFP last date
20 June 2024
Reseach Article

Failure Risk Exposure Based Test Prioritization for Sequential Non-iterative System

Published on December 2011 by Rajesh Purohit, K.R. Chowdhary
International Conference on Electronics, Information and Communication Engineering
Foundation of Computer Science USA
ICEICE - Number 2
December 2011
Authors: Rajesh Purohit, K.R. Chowdhary
e4ae7577-8e19-41e4-bbe3-12022c693918

Rajesh Purohit, K.R. Chowdhary . Failure Risk Exposure Based Test Prioritization for Sequential Non-iterative System. International Conference on Electronics, Information and Communication Engineering. ICEICE, 2 (December 2011), 22-24.

@article{
author = { Rajesh Purohit, K.R. Chowdhary },
title = { Failure Risk Exposure Based Test Prioritization for Sequential Non-iterative System },
journal = { International Conference on Electronics, Information and Communication Engineering },
issue_date = { December 2011 },
volume = { ICEICE },
number = { 2 },
month = { December },
year = { 2011 },
issn = 0975-8887,
pages = { 22-24 },
numpages = 3,
url = { /specialissues/iceice/number2/4261-iceice015/ },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Special Issue Article
%1 International Conference on Electronics, Information and Communication Engineering
%A Rajesh Purohit
%A K.R. Chowdhary
%T Failure Risk Exposure Based Test Prioritization for Sequential Non-iterative System
%J International Conference on Electronics, Information and Communication Engineering
%@ 0975-8887
%V ICEICE
%N 2
%P 22-24
%D 2011
%I International Journal of Computer Applications
Abstract

To test a system a large number of test cases are required to be generated and applied to the candidate system. In most of the methodologies the testing phase is placed at the end of development life cycle. The time constraint is more in this phase as compared to any other. Hence testing objective is to gain confidence in the product by verifying its reliability. For a reliable system, testing has to be performed more extensively on specific part(s) of the system, which is expected to be used more. In this paper, two additional parameters i.e. risk probability and associated impact expected in each subsystem is considered along with usages pattern. The test case priority is calculated on the basis of effective risk exposure of the even sequence.

References
  1. Whittaker, J. and Thomason, M. (1992) “A Markov Chain Model for Statistical Software Testing”, IEEE Transactions on Software Engineering, Vol. 20.
  2. Carlo Ghezzi, Mehdi Jazayeri, Dino Mandrioli, “Fundamentals of Software Engineering”, Pearson Education, 2003.
  3. Hiroshi Othera and Shigeru, "Optimal Allocation & Control Problems for Software-Testing Resources", IEEE Trans. on Reliability, Vol. 39, No. 2, 1990 June, pp. 171-176.
  4. Harry Robinson, “Graph Theory Techniques in Model-Based Testing”, International Conference on Testing Computer Software, 1999.
  5. Lu Lu, Christine M. Anderson-Cook,”Using age and usage for prediction of reliability of an arbitrary system from a finite population”, Quality and Reliability Engineering International Volume 27, Issue 2, pages 179–190.
Index Terms

Computer Science
Information Sciences

Keywords

Usage Pattern Finite State Machine Failure State Risk Impact Risk Exposure Reliability