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Fault Diagnosis in Analog Integrated Circuits Using Artificial Neural Networks

by A.Rathinam, R. Srinivasa Raghavan, R.Venkatraman
journal cover thumbnail
International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 1 - Number 27
Year of Publication: 2010
Authors: A.Rathinam, R. Srinivasa Raghavan, R.Venkatraman
10.5120/497-811

A.Rathinam, R. Srinivasa Raghavan, R.Venkatraman . Fault Diagnosis in Analog Integrated Circuits Using Artificial Neural Networks. International Journal of Computer Applications. 1, 27 ( February 2010), 63-69. DOI=10.5120/497-811

@article{ 10.5120/497-811,
author = { A.Rathinam, R. Srinivasa Raghavan, R.Venkatraman },
title = { Fault Diagnosis in Analog Integrated Circuits Using Artificial Neural Networks },
journal = { International Journal of Computer Applications },
issue_date = { February 2010 },
volume = { 1 },
number = { 27 },
month = { February },
year = { 2010 },
issn = { 0975-8887 },
pages = { 63-69 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume1/number27/497-811/ },
doi = { 10.5120/497-811 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T19:49:07.607295+05:30
%A A.Rathinam
%A R. Srinivasa Raghavan
%A R.Venkatraman
%T Fault Diagnosis in Analog Integrated Circuits Using Artificial Neural Networks
%J International Journal of Computer Applications
%@ 0975-8887
%V 1
%N 27
%P 63-69
%D 2010
%I Foundation of Computer Science (FCS), NY, USA
Abstract

One of the most important tasks in design and manufacturing of integrated circuits is the testing phase. Distinguishing between faulty and fault free ICs is a difficult task Therefore, simulations are being done for different circuits to identify fault free and faulty circuits. Analog circuits like Low pass filter, High pass filter, Band pass filter, Band reject filter, State variable filter, Tow Thomas Biquadratic filter etc. The parameters measured are the variations in node voltages & DC supply current. These parameters are specifically chosen for extracting the data, because of their ability to improve the efficiency of ANN.

References
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Index Terms

Computer Science
Information Sciences

Keywords

Neural Networks free ICs DC supply

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