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Reseach Article

Fault Tolerant QCA Logic Design With Coupled Majority-Minority Gate

by Mamata Dalui, Bibhash Sen, Biplab k Sikdar
journal cover thumbnail
International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 1 - Number 29
Year of Publication: 2010
Authors: Mamata Dalui, Bibhash Sen, Biplab k Sikdar
10.5120/596-645

Mamata Dalui, Bibhash Sen, Biplab k Sikdar . Fault Tolerant QCA Logic Design With Coupled Majority-Minority Gate. International Journal of Computer Applications. 1, 29 ( February 2010), 81-87. DOI=10.5120/596-645

@article{ 10.5120/596-645,
author = { Mamata Dalui, Bibhash Sen, Biplab k Sikdar },
title = { Fault Tolerant QCA Logic Design With Coupled Majority-Minority Gate },
journal = { International Journal of Computer Applications },
issue_date = { February 2010 },
volume = { 1 },
number = { 29 },
month = { February },
year = { 2010 },
issn = { 0975-8887 },
pages = { 81-87 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume1/number29/596-645/ },
doi = { 10.5120/596-645 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T19:43:20.562743+05:30
%A Mamata Dalui
%A Bibhash Sen
%A Biplab k Sikdar
%T Fault Tolerant QCA Logic Design With Coupled Majority-Minority Gate
%J International Journal of Computer Applications
%@ 0975-8887
%V 1
%N 29
%P 81-87
%D 2010
%I Foundation of Computer Science (FCS), NY, USA
Abstract

Synthesis of efficient DFT (Design for Testability) logic is of prime importance in robustly testable design of QCA based logic circuits. An ingenious universal QCA gate structure, Coupled Majority-Minority (CMVMIN) gate, realizes majority and minority functions simultaneously in its 2-outputs. This device enables area saving implementation of complex QCA logic. In the current work, we investigate cost effective DFT for QCA designs realized with CMVMIN. The fault effects at the gate outputs due to cell deposition and cell misplacement defects are characterized for concurrent testable circuit design. The effective use of unutilized outputs of CMVMIN gates, realizing a circuit, leads to the proposed fault tolerant design that may not be possible with the conventional gate structures.

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Index Terms

Computer Science
Information Sciences

Keywords

Fault Tolerant DFT (Design for Testability) Coupled Majority-Minority