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Reseach Article

EgyCD Visualization for Code Clones

by Ali El-Matarawy, Mohammad El-Ramly, Reem Bahgat
International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
Volume 142 - Number 4
Year of Publication: 2016
Authors: Ali El-Matarawy, Mohammad El-Ramly, Reem Bahgat
10.5120/ijca2016909741

Ali El-Matarawy, Mohammad El-Ramly, Reem Bahgat . EgyCD Visualization for Code Clones. International Journal of Computer Applications. 142, 4 ( May 2016), 16-19. DOI=10.5120/ijca2016909741

@article{ 10.5120/ijca2016909741,
author = { Ali El-Matarawy, Mohammad El-Ramly, Reem Bahgat },
title = { EgyCD Visualization for Code Clones },
journal = { International Journal of Computer Applications },
issue_date = { May 2016 },
volume = { 142 },
number = { 4 },
month = { May },
year = { 2016 },
issn = { 0975-8887 },
pages = { 16-19 },
numpages = {9},
url = { https://ijcaonline.org/archives/volume142/number4/24884-2016909741/ },
doi = { 10.5120/ijca2016909741 },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Journal Article
%1 2024-02-06T23:44:03.224973+05:30
%A Ali El-Matarawy
%A Mohammad El-Ramly
%A Reem Bahgat
%T EgyCD Visualization for Code Clones
%J International Journal of Computer Applications
%@ 0975-8887
%V 142
%N 4
%P 16-19
%D 2016
%I Foundation of Computer Science (FCS), NY, USA
Abstract

This research presents a new visualization for code clones using EgyCD code clone detector which is based on sequential pattern mining. EgyCD presents a new graph design in which no lines has been drawn, this simplify the graph, no need for the lines since the main objective is to ease the manual management. EgyCD is independent in its visualization in which no graph tools are required for visualizing its code clones, finally supports a very nice way to ease the manual code clone management by the user.

References
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  5. A. Matarawy, M. El-Ramly and R. Bahgat. “ Plagiarism Detection using Sequential Pattern Mining, International Journal of Applied Information Systems (IJAIS) – ISSN : 2249-0868 Foundation of Computer Science FCS, New York, USA Volume 5–No.2, January 2013 – www.ijais.or , pp 24-29.
  6. A. Matarawy, M. El-Ramly and R. Bahgat. “ Plagiarism Detection using Sequential Pattern Mining, International Journal of Applied Information Systems (IJAIS) – ISSN : 2249-0868 Foundation of Computer Science FCS, New York, USA Volume 5–No.2, January 2013 – www.ijais.or , pp 24-29.
  7. A. Matarawy, M. El-Ramly and R. Bahgat. “Parallel and Distributed Code Clone Detection using Sequential Pattern Mining”, International Journal of Computer Applications (0975 – 8887) Volume 62– No.10, January 2013, pp 25-31.
Index Terms

Computer Science
Information Sciences

Keywords

Code clones visualization data mining clone class clone pairs sequential pattern mining.