CFP last date
22 September 2025
International Journal of Computer Applications
A Publication of Foundation of Computer Science, Delaware
Scholarly peer reviewed publication
Home
Archives
About Us
The Model
Indexing, Abstracting, and Archiving
Editorial Board
Review Board
Associate Editorial Board
Policy on Publication Ethics
Vision & Mission
Publication Ethics and Malpractice Statement
For Authors
Call for Paper - Submission Open
Topics
Journal Prints
Article Correction Policy
Publishing practices
IJCA Frequently Asked Queries
Authors Self-Archiving Policy
Citation Improvement
Home
Archives
Volume 17
Number 2
Call for Paper
October Edition
IJCA solicits high quality original research papers for the upcoming October edition of the journal. The last date of research paper submission is 22 September 2025
Submit your paper
Know more
The week's pick
Real-Time Video Transmission using Gaussian Minimum Shift Keying (GMSK) on GNU Radio and USRP for Radiation Monitoring Applications in Nuclear Reactors
Nabiha Ben Abid
Abdalla M. Khattab
Hani A.M. Harb
Chokri Souani
Random Articles
Volume 17
Number 2
Smart Sensor Design Analysis in Brain Machine Interface using Labview
Authors: Mamatha M.N. , S. Ramachandran , M.Chandrasekaran
A Comparative Study on Optimal Conductor Selection for Radial Distribution Network using Conventional and Genetic Algorithm Approach
Authors: MuraliMohan Thenepalle
Change Management Strategies for Effective Enterprise Resource Planning Systems: A Case Study of a Saudi Company
Authors: Hailah Alballaa , Abdullah S. Al-Mudimigh
Digital Preoperative Planning for Total Hip Replacement Using Two Dimensional X-ray Imaging
Authors: Azrulhizam Shapi i , Riza Sulaiman , Abd Yazid Mohd Kassim
A Novel Application of Extended Kalman Filter for Efficient Information Processing in Subsurfaces
Authors: Dimple Juneja , Atul Sharma , A.K Sharma
A Frequent Term and Semantic Similarity based Single Document Text Summarization Algorithm
Authors: Naresh Kumar Nagwani , Shrish Verma
Data Clustering Approach to Industrial Process Monitoring, Fault Detection and Isolation
Authors: Kiran Jyoti , Satyaveer Singh