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Reseach Article

Study and Simulation of CMOS Non-Sequential Phase Detector

Published on May 2012 by Manoj Kumar, Sunil Singh
National Workshop-Cum-Conference on Recent Trends in Mathematics and Computing 2011
Foundation of Computer Science USA
RTMC - Number 4
May 2012
Authors: Manoj Kumar, Sunil Singh
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Manoj Kumar, Sunil Singh . Study and Simulation of CMOS Non-Sequential Phase Detector. National Workshop-Cum-Conference on Recent Trends in Mathematics and Computing 2011. RTMC, 4 (May 2012), 31-35.

@article{
author = { Manoj Kumar, Sunil Singh },
title = { Study and Simulation of CMOS Non-Sequential Phase Detector },
journal = { National Workshop-Cum-Conference on Recent Trends in Mathematics and Computing 2011 },
issue_date = { May 2012 },
volume = { RTMC },
number = { 4 },
month = { May },
year = { 2012 },
issn = 0975-8887,
pages = { 31-35 },
numpages = 5,
url = { /proceedings/rtmc/number4/6648-1031/ },
publisher = {Foundation of Computer Science (FCS), NY, USA},
address = {New York, USA}
}
%0 Proceeding Article
%1 National Workshop-Cum-Conference on Recent Trends in Mathematics and Computing 2011
%A Manoj Kumar
%A Sunil Singh
%T Study and Simulation of CMOS Non-Sequential Phase Detector
%J National Workshop-Cum-Conference on Recent Trends in Mathematics and Computing 2011
%@ 0975-8887
%V RTMC
%N 4
%P 31-35
%D 2012
%I International Journal of Computer Applications
Abstract

This paper presents the design of non-sequential phase detector using different XOR gates and compares the results with conventional circuit. Phase detector circuit has been modified using transmission gate logic XOR gate and 4T XNOR gate. The simulation results are focused on accounting the frequency operation and power dissipation of these phase detectors. The results shown in this paper are obtained using 0. 35?m CMOS technology on SPICE simulator with 3. 3V supply voltage

References
  1. M. Mansuri, D. Lin, and C. K. Yang, "Fast Frequency Acquisition Phase-Frequency Detectors for G Samples/s Phase –Locked Loops," IEEE Journal of solid-state circuit, vol. 37, no. 10, 2002.
  2. K. H. Cheng, T. You, S. Jiang, and W. Yang, "A difference Detector PFD for Low Jitter PLL," The 8th IEEE International Conference on Circuits and Systems ICECS 2001, vol. 1, 2-5 Sept. 2001.
  3. Charles R. Hogge, "A self Correcting Clock Recovery Circuit," IEEE Journal of Lightwave Technology, vol. 1312-1314, Dec. 1985.
  4. Reto Zimmermann, Wolfgang Fichtner, "Low-Power Logic Styles: CMOS versus Pass-Transistor Logic," IEEE Journal of Solid-State Circuits, vol. 32 no. 7, 1079-1090, July 1997.
  5. Yonghui Tang, Randall L. Geiger, "A Non-sequential Phase Detector for PLL-based High-Speed Data/Clock Recovery," Proc. 43rd IEEE Midwest Symp. on Circuits and Systems, Lansing MI, Aug 8-11, 2000.
  6. K. Arshak, O. Abubaker E. Jafer, "Design and Simulation Difference Types CMOS Phase Frequency Detector for high speed and low jitter PLL," Proceeding of the Fifth IEEE International Caracas Conference on Devices, Circuits and Systems, Dominican Republic, Nov. 3-5, 2004.
  7. J. D. H Alexander, "Clock Recovery from Random Binary Signals," Electronic Letters, vol. 11, pp. 541-542, October, 1975.
  8. Hung Tien Bui, Abdul Karim Al-Sherraidah, and Yuke Wang, "New 4-Transistor XOR and XNOR Designs," 2nd IEEE Asia pacific conference, Aug 28-30, 2000.
Index Terms

Computer Science
Information Sciences

Keywords

Phase Locked Loops (pll) Are Most Widely Used For Synchronization Of Clock Phase Digital Circuits And High Performance Microprocessor System [1]. The Phase Detector Is The Main Part Of The Pll And There Is An Increasing Demand Of High Frequency Operation Pll. The Action Of Phase Detector Enables The Phase Differences In The Loop To Be Detected And The Resultant Error Voltage To Be Produced. A Phase Detector Can Monitor The Difference Between Input Data Frequency And The Voltage Controlled Oscillator Output And Generate An Up Signal If Input Data Leads The Clock Output Of Vco And A Down If Input Data Lags The Clock [2]. The Most Desirable Feature Of A Phase Detector Is To Have Zero Dead Zone Which Is Responsible For Increasing Phase Noise. Dead Zone Occurs When The Phase Detector Will Not Able To Detect Any Phase Error When The Phase Error Is Present. Various Types Of Phase Detector Described In Literature Which Are Applicable For Random Data Applications. The Hogge's [3] And Alexander [4] Phase Detectors Have Been Most Widely Used. There Are Some Performance Limitations In These Sequential Phase Detectors. Here In This Paper Modification In Non-sequential Circuits Has Been Done With Transmission Gate Logic Xor Gate And 4t Xnor Gate. Further Different Phase Detectors Are Compared With Its Phase Characteristics And Power Dissipation. Rest Of Paper Is Organized As: In Section Ii The Structure And Operation Of Phase Detector With Complemtgl Xor Gatentary Pass Transistor Logic (cpl) Is Explained. In Section Iii The Modifications Have Been Proposed With Xor And Xnor Gates. In Section Iv The Results Have Been Described. Finally The Conclusions Have Been Drawn In Section V.